Patrick J. Lee works on patent litigations and mediations, as well as patent prosecution matters for major companies. Mr. Lee has also performed due diligence on certain patents.
Prior to joining the firm, Mr. Lee was a patent examiner with the United States Patent and Trademark Office (“USPTO”). Mr. Lee examined applications in the field of visible light detection systems, including camera systems, semiconductor detectors, night vision goggles, and security systems. While at the USPTO, Mr. Lee also served as a Judicial Extern at the Board of Patent Appeals and Interferences where he drafted opinions in appeal proceedings and performed evaluations for interference hearings.
Mr. Lee graduated with a J.D. from George Mason University School of Law. Mr. Lee attended the University of Michigan, where he earned a bachelor’s degree with summa cum laude honors and a master’s degree in chemical engineering. As a graduate student at the University of Michigan, Mr. Lee served as a graduate student instructor for a fluid mechanics class and a chemical process simulation and design class.
Mr. Lee is licensed to practice before the USPTO.